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Sneak Circuit Analysis of Selected Portions of the Component Test Facility D2-118600-1, 1976-11-08

 File — Box: 4, Folder: 6.6.6

Scope and Contents

From the Collection:

The John P. Rankin Collection includes approximately 250 documents contained within 183 folders, and 8 primary subjects covered within this collection include a wide range of aerospace technology, such "topological sneak circuit analysis" and "Common Case Failure Analysis," the latter developed to use sneak circuit analysis core elements to determine susceptibilities of a complex system to experience critical unplanned events caused by build-up of multiple unnoticed failure events and unexpected operations or environmental circumstances. Actual project final reports are included in the collection along with technical papers.

Dates

  • Other: 1976-11-08

Creator

Conditions Governing Access

This collection is open for research in the Archives & Special Collections reading room. Handling guidelines and use restrictions will be communicated and enforced by archives staff members.

Extent

From the Collection: 11.5 Linear feet (23 Metal Edge Boxes)

Language of Materials

From the Collection: English

Repository Details

Part of the The University of Alabama in Huntsville Archives & Special Collections Repository

Contact:
M. Louis Salmon Library
301 Sparkman Drive
Huntsville Alabama 35899 United States of America
256-824-6523